ToF-SIMS:
Surface Analysis by Mass Spectrometry

Edited by John C. Vickerman and David Briggs

[ISBN 1-901019-03-9]
Published in association with IM Publications

The ToF book contains 28 chapters by internationally regarded experts. These can be purchased individually on-line or as a hardcover book.

The chapters are arranged into the following sections;

Prologue

ToF-SIMS - An Introduction - what is it and what can it do? - John C. Vickerman
History of Static SIMS – a personal perspective - Alfred Benninghoven

Instrumentation

Time-of-flight mass analysers - Bruno Schueler
Primary ion beam systems - Rowland Hill
Sample handling - Fraser Reich

Fundamentals

Status of Cascade Theory - Herbert Urbassek
Fundamental aspects of organic SIMS - Arnaud Delcorte
Fundamental aspects of inorganic SIMS - Annemie Adriaens
Molecular dynamics simulations - the theoretical partner to static SIMS experiments - Barbara Garrison

Optimisation Methods

Optimisation of operating conditions - Ian Gilmore
Cationisation - Birgit Hagenhoff
Polyatomic primary beams - Michael J. Van Stipdonk
Laser post-ionisation - Fundamentals - Andreas Wucher
Laser post-ionisation for quantitative elemental analysis - Michael Pellin
Laser post-ionisation for molecular analysis - Nicholas Lockyer

Data Interpretation

Interpretation of spectra - David Briggs
Image analysis - Bonnie Tyler

Analytical Applications

Surface Characterisation of Polymers - David Briggs
Analysis of bulk polymers - Alan A Galuska
Quantitative characterization of polymer surfaces - Xavier Vanden Eynde
Self-assembled monolayers - Graham Leggett
Biological systems - Nick Winograd
Biomolecules on surfaces - Ashutosh Chilkoti
Atmospheric Chemistry - Heather Gamble
Contamination monitoring and failure analysis - Pat Lindley
Applications in Catalysis - Hans W Niemansverdriet
Photographic Materials - Renaat Gijbels
Ultra-shallow depth profiling - Ewald Niehius

ToF-SIMS: Surface Analysis by Mass Spectrometry